The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2005

Filed:

May. 25, 2000
Applicant:

Tomoyoshi Yabe, Aichi, JP;

Inventor:

Tomoyoshi Yabe, Aichi, JP;

Assignee:

Nichiha Corporation, Nagoya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 900 ;
U.S. Cl.
CPC ...
Abstract

An inspection system which enables even the production control section located at a remote place to trace and inspect the changing process of the external appearance, after undergoing through each manufacturing process, of a great number of work boards that have been placed on a continuous work line. According to this inspection system, the moving velocity of work board being transferred by means of a transfer roller is measured by a rotary pulse encoder, and the sampling rate of a CCD line sensor camera is controlled to obtain a surface image data of the moving work board.


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