The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2005

Filed:

Dec. 16, 2002
Applicants:

Harry F. Schramm, Winchester, TN (US);

Bruce Kaiser, Draper, UT (US);

Robert D. Kuhlman, Richland, WA (US);

Therese Howe, Kennewick, WA (US);

Robert Shannon, Burbank, WA (US);

Ken Wheeler, Kennewick, WA (US);

Inventors:

Harry F. Schramm, Winchester, TN (US);

Bruce Kaiser, Draper, UT (US);

Robert D. Kuhlman, Richland, WA (US);

Therese Howe, Kennewick, WA (US);

Robert Shannon, Burbank, WA (US);

Ken Wheeler, Kennewick, WA (US);

Assignee:

Keymaster Technologies, Inc., Kennewick, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23223 ;
U.S. Cl.
CPC ...
Abstract

Apparatus and methods in which one or more elemental taggants that are extrinsically placed in an object are detected by x-ray fluorescence analysis to identify or authenticate the object are described. The taggant is manufactured as part of the object or the taggant is placed into a coating, packaging, label, or otherwise embedded onto the object for the purpose of later verifying the presence or absence of these elements by x-ray fluorescence. The taggant is then analyzed by XRF and the analysis is then converted into a 2D symbol format that can be used in various security and authentication applications. By using x-ray fluorescence analysis, the apparatus and methods of the invention are simple and easy to use, without the limitations experience by current anti-counterfeiting technologies.


Find Patent Forward Citations

Loading…