The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2005
Filed:
Jul. 26, 2002
Jeff Brooker, Oakhill, VA (US);
Jeff Brooker, Oakhill, VA (US);
Atto Bioscience Inc., Rockville, MD (US);
Abstract
A microscope optical system in which both a sample and the viewing optics can be maintained stationary, while at the same time different points or fields of view of the sample can be examined. In the microscope optical system a sample is provided, e.g. on a stage, to be maintained in a stationary position when the sample is viewed. Further, viewing optics of the microscope optical system can be maintained in a stationary position when the sample is viewed. Intermediate optics between the stage and the viewing optics are moveable so that different portions of the sample can be examined without having to move the sample and without having to move the viewing optics.