The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2005

Filed:

Jan. 29, 2002
Applicants:

Peter Thoma, Rottenburg, DE;

Emmerich Mueller, Aidlingen, DE;

Tobias Ruf, Renningen, DE;

Harald Rosenfeldt, Hamburg, DE;

Inventors:

Peter Thoma, Rottenburg, DE;

Emmerich Mueller, Aidlingen, DE;

Tobias Ruf, Renningen, DE;

Harald Rosenfeldt, Hamburg, DE;

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 400 ;
U.S. Cl.
CPC ...
Abstract

An apparatus and a method of determination of at least one optical parameter of an optical signal includes providing a beam of the optical signal having a diameter, manipulating the beam, the manipulation having polarization properties, the properties being dependent of the position in the beam laterally with respect to a direction of propagation of the beam during manipulation, detecting in intensities at least three parts of the beam in their dependence of the position in the beam laterally with respect to a direction of propagation of the beam during detection.


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