The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2005
Filed:
Aug. 25, 1999
Applicants:
William B. Euler, Narragansett, RI (US);
Otto J. Gregory, Wakefield, RI (US);
Gregg S. Huston, Wakefield, RI (US);
Inventors:
William B. Euler, Narragansett, RI (US);
Otto J. Gregory, Wakefield, RI (US);
Gregg S. Huston, Wakefield, RI (US);
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 902 ;
U.S. Cl.
CPC ...
Abstract
The invention relates to polymeric/semiconductor thin film strain gauges comprising visible light from spectrometer () which is directed onto a thin film passive sensor () having a transparent glass substrate () and a laminated construction in succession from the substrate (), of a polyimide layer() a polysiloxane layer () filled with alumina particles, a polyimide layer () and a polysiloxane layer () filled with alumina particles.