The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2005

Filed:

May. 27, 2003
Applicants:

Himanshu J. Verma, Mountain View, CA (US);

Anthony P. Calderone, Soquel, CA (US);

Richard D. Duce, San Jose, CA (US);

Inventors:

Himanshu J. Verma, Mountain View, CA (US);

Anthony P. Calderone, Soquel, CA (US);

Richard D. Duce, San Jose, CA (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03B 2700 ;
U.S. Cl.
CPC ...
Abstract

A test oscillator circuit separately measures the signal propagation delay for both rising and falling edges through one or more multi-input combinatorial logic circuits. A number of components are configured in a loop so that they together form a free-running ring oscillator. Each synchronous component passes signal edges to a subsequent component in the ring, so the oscillator produces an oscillating test signal in which the period relates to the delays through the components. In some embodiments, the multi-input combinatorial logic circuits emulate tri-state buffers. These embodiments characterize the speed at which these logic circuits enable and disable signal paths.


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