The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2005

Filed:

Jun. 05, 2002
Applicants:

Jeffrey D. Birdsley, Austin, TX (US);

Michael R. Bruce, Austin, TX (US);

Brennan V. Davis, Austin, TX (US);

Rosalinda M. Ring, Austin, TX (US);

Daniel L. Stone, Cedar Park, TX (US);

Inventors:

Jeffrey D. Birdsley, Austin, TX (US);

Michael R. Bruce, Austin, TX (US);

Brennan V. Davis, Austin, TX (US);

Rosalinda M. Ring, Austin, TX (US);

Daniel L. Stone, Cedar Park, TX (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31303 ; G01R 3128 ;
U.S. Cl.
CPC ...
Abstract

Semiconductor analysis is improved via the use of fiber optic communications. According to an example embodiment of the present invention, a stimulation device is adapted to stimulate an integrated circuit die, and the die generates a response to the stimulation. An optical signal generator, either incorporated into the die or coupled to the die, detects the response, converts the response to an optical signal and transmits the optical signal. The optical signal is received at a testing arrangement adapted to analyze the die therefrom. The optical signal is used to analyze the die, improving signal quality and the ability to perform high-speed analysis of the die.


Find Patent Forward Citations

Loading…