The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2005

Filed:

Aug. 11, 2000
Applicants:

Manfred Dick, Gefell, DE;

Eckhard Schroeder, Eckental, DE;

Joachim Fiedler, Crailsheim, DE;

Inventors:

Manfred Dick, Gefell, DE;

Eckhard Schroeder, Eckental, DE;

Joachim Fiedler, Crailsheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 310 ;
U.S. Cl.
CPC ...
Abstract

The invention relates to a method and a device for the complete correction of sight defects in the human eye. Combinations of measuring, and processing methods are described which when applied as disclosed in the invention, make it possible to fully correct sight defects in the human eye. Measuring methods are used which can precisely scan the surface of the cornea and also register other imaging defects in the light path up to the retina. Computer-aided of said measuring results determined when combined with calculation of ideally corrected ocular lenses (for example after cataract operations) or ideally corrected surfaces of the cornea opens up the possibility of manufacturing a patient-specific lens and/or achieving ideal correction of the cornea using preferably a topography-supported spot-scanning-excimer laser system.


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