The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2005

Filed:

Mar. 15, 2002
Applicants:

Wolfgang Krieg, Karlsruhe, DE;

Achim Hugger, Karlsruhe, DE;

Inventors:

Wolfgang Krieg, Karlsruhe, DE;

Achim Hugger, Karlsruhe, DE;

Assignee:

PII Pipetronix GmbH, Stutensee, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2900 ;
U.S. Cl.
CPC ...
Abstract

The invention concerns a method and a device for inspecting pipelines, in particular for detecting defects in pipelines by means of ultrasound. Towards this end, measuring sensors transmit ultrasound signals during passage through a pipeline. The signals reflected on boundary regions of a pipeline wall, e.g. surfaces or defects, are then measured and evaluated. The invention is characterized in that partial regions of the measuring sensors (virtual sensors) formed of a plurality of neighboring sensor elements irradiate ultrasound signals into the pipe wall at at least one radiation angle which is inclined with respect to the normal to the pipe wall and the signals reflected at boundary regions of the pipe wall are received by same and/or other partial regions of the respective measuring sensors, wherein defects in the pipe wall are determined by evaluation of the acoustical signals reflected by different boundary regions.


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