The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2005

Filed:

Dec. 07, 2000
Applicants:

Harrell Hoffman, Austin, TX (US);

John Henry Westermann, Jr., Endicott, NY (US);

Inventors:

Harrell Hoffman, Austin, TX (US);

John Henry Westermann, Jr., Endicott, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1750 ;
U.S. Cl.
CPC ...
Abstract

A method and system are described in a logic simulator machine for efficiently creating a trace of an array which includes a plurality of storage locations. The logic simulator machine executes a test routine. Prior to executing the test routine, an initial copy of all data included within each of the storage locations of the array is stored as a first trace of the array. During execution of a first cycle the test routine, all of the write control inputs into the array are read to identify ones of the storage locations which were modified during the execution of the first cycle. A new trace of the array is generated which includes a copy of all of the data of the first trace. In addition, only those ones of the storage locations in the first trace which were modified during the first cycle are updated. A trace is thus generated by updating only those ones of the storage locations which were modified during execution of a cycle of the test routine.


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