The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6847696 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 25, 2005

Filed:

Oct. 21, 2003
Applicants:

Hideyuki Chinju, Shioya-Gun, JP;

Yutaka Watanabe, Utsunomiya, JP;

Akira Miyake, Utsunomiya, JP;

Nobuaki Oqushi, Utsunomiya, JP;

Inventors:

Hideyuki Chinju, Shioya-Gun, JP;

Yutaka Watanabe, Utsunomiya, JP;

Akira Miyake, Utsunomiya, JP;

Nobuaki Oqushi, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 500 ;
U.S. Cl.
CPC ...
Abstract

A measurement apparatus has a first detector for measuring an intensity such that a sheet-shaped beam of synchrotron radiation is integrated over the entire range of the beam in the thickness direction thereof; a second detector for measuring the intensity of the beam at two points where positions along the direction are different; and a calculating device for calculating the magnitude of the beam in the direction on the basis of the detections by the first and second detectors.


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