The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2005

Filed:

Apr. 27, 2001
Applicants:

Changhuei Yang, Cambridge, MA (US);

Adam P. Wax, Boston, MA (US);

Lev T. Perelman, Brookline, MA (US);

Ramachandra R. Dasari, Lexington, MA (US);

Michael S. Feld, Newton, MA (US);

Inventors:

Changhuei Yang, Cambridge, MA (US);

Adam P. Wax, Boston, MA (US);

Lev T. Perelman, Brookline, MA (US);

Ramachandra R. Dasari, Lexington, MA (US);

Michael S. Feld, Newton, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 902 ;
U.S. Cl.
CPC ...
Abstract

The present invention relates to systems and methods of field-based light scattering spectroscopy. These systems and methods provide for the diagnosis of tissue by measuring the size and distribution of cellular characteristics. Field based measurements provide phase information resulting from the interaction of scatterers within the material and the incident wavefront. These measurements can be used to provide three dimensional images of tissue.


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