The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6847455 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 25, 2005

Filed:

Sep. 26, 2002
Applicants:

Tony L. Schmitz, Gainesville, FL (US);

John F. Beckwith, Indialantic, FL (US);

Inventors:

Tony L. Schmitz, Gainesville, FL (US);

John F. Beckwith, Indialantic, FL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 902 ;
U.S. Cl.
CPC ...
Abstract

Displacement measuring interferometer systems and methods are disclosed. One or more acousto-optic modulators for receiving a laser light beam from a laser light source can be utilized to split the laser light beam into two or more laser light beams, while spatially separating frequencies thereof. One or more reflective mechanisms can be utilized to reflect one or more of the laser light beams back to the acousto-optic modulator. Interference of two or more of the laser light beams generally at the acousto-optic modulator can provide an interfered laser light beam thereof. A detector for receiving the interfered laser light beam can be utilized to provide interferometer measurement data.


Find Patent Forward Citations

Schmitz, Tony. (2005). Heterodyne interferometer with angstrom-level periodic nonlinearity (U.S. Patent No. 6847455). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6847455

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