The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2005
Filed:
Nov. 05, 2001
Ira Jeffery Bush, Los Angeles, CA (US);
Ira Jeffery Bush, Los Angeles, CA (US);
OptiPhase, Inc., Van Nuys, CA (US);
Abstract
An autocorrelator apparatus and method for economically measuring physical properties of an object where the measurement path is at least semi-translucent to light, such as thicknesses in multilayered optical structures, group index of refraction, and distance to a surface. The apparatus includes a non-coherent light fiber interferometer and an optional coherent light fiber interferometer in association so as to share PZT fiber modulators. Thickness and boundary extent measurements can be made, for example, of solids, liquids, liquids moving along a horizontal plane, or liquids flowing down a plane.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile