The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2005

Filed:

Sep. 30, 2003
Applicant:

Hiroki Ohtsu, Kanagawa, JP;

Inventor:

Hiroki Ohtsu, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1116 ;
U.S. Cl.
CPC ...
Abstract

A tape surface strain inspecting apparatus which optically inspects a surface of a tape and surface strain of the tape is characterized by being provided with a light emitting device emitting a light on the surface of the tape and forming a linear image which slants at a predetermined angle for a tape width direction of the tape, an image taking device taking the image formed on the surface of the tape, an image inspecting means investigating an edge linearity of an image taken by said image taking device, and a strain discriminating means discriminating largeness of surface strain of the tape based on an inspection result by the image inspecting means.


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