The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2005
Filed:
Jan. 17, 2002
Rajendra K. Shenoy, Dixhills, NY (US);
Jevan Damadian, East Northport, NY (US);
Rajendra K. Shenoy, Dixhills, NY (US);
Jevan Damadian, East Northport, NY (US);
Fonar Corporation, Melville, NY (US);
Abstract
An NMR imaging process utilizes both driven equilibrium and fast-spin echo techniques to acquire image data. The fast-spin echo technique is a multi-echo imaging sequence, where a 90-degree RF pulse applied at the center of any echo turns the magnetization back in the direction of the static magnetic field. Within a short waiting time after that pulse, the spins are ready to be excited again. The sequence follows a first 90-degree RF pulse by a series of n 180-degree RF pulses, followed by n echoes. A second 90-degree RF pulse applied to the nth echo returns the magnetization. A multiple single-slice mode is utilized to acquire individual slice images one at a time. A continuous single-slice mode is utilized to acquire individual slice images automatically in sequence over the region of interest. In either mode, adjacent slices can be made to overlap to a degree ranging from 0% to 100%.