The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2005
Filed:
Aug. 29, 2003
Christopher Williams Crowley, San Diego, CA (US);
Mitsuaki Arakawa, San Diego, CA (US);
Simon Peter Beevor, Poway, CA (US);
Christopher Williams Crowley, San Diego, CA (US);
Mitsuaki Arakawa, San Diego, CA (US);
Simon Peter Beevor, Poway, CA (US);
Quantum Magnetics, Inc., San Diego, CA (US);
Abstract
An inspection system including a radio frequency (RF) subsystem and a quadrupole resonance (QR) tube array coil. The RF subsystem may include a variable frequency RF source to provide RF excitation signals at a frequency generally corresponding to predetermined, characteristic QR frequencies of a specimen. The QR tube array coil may be implemented using a plurality of conductive tubes defining a cavity of predetermined volume. Typically, the plurality of conductive tubes are spaced at a distance relative to one another to form at least two non-conductive gaps between tubes in the array. After RF excitation signals are applied to the specimen within the cavity, the QR tube array coil may generate a QR output signal responsive to QR signals generated by the specimen.