The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2005
Filed:
Jun. 15, 2000
Yukie Tokiwa, Hitachinaka, JP;
Kyoko Imai, Hitachinaka, JP;
Shigeki Matsubara, Hitachinaka, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An automatic analysis apparatus containing a plurality of measurement channels used to measure reaction occurred in a reaction container into which both a reagent and a sample are entered, is arranged by employing: a data processing unit for producing calibration information, first quality control information, and second quality control information; the calibration information every measurement channel being produced based upon calibration data obtained by measuring a calibration sample, the first quality control information related to a quality for each of the measurement channels being produced based upon measurement data acquired by measuring a quality controlling sample by the respective measurement channels, and also the second quality control information related to an entire quality of the plural measurement channels being produced based upon the measurement data; and a display unit for simultaneously displaying the calibration information, the first quality control information, and the second quality control information given by the data processing unit on a single screen.