The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2005
Filed:
Apr. 07, 2003
Takashi Igarashi, Tokyo, JP;
Hisanori Akiyama, Tokyo, JP;
Masahiro Jinbo, Tokyo, JP;
Ryosuke Sato, Tokyo, JP;
Takashi Daimaru, Tokyo, JP;
Takashi Igarashi, Tokyo, JP;
Hisanori Akiyama, Tokyo, JP;
Masahiro Jinbo, Tokyo, JP;
Ryosuke Sato, Tokyo, JP;
Takashi Daimaru, Tokyo, JP;
Hoya Corporation, Tokyo, JP;
Abstract
A spectacle frame shape measuring apparatus includes a measurement element holding mechanism. The measurement element holding mechanism holds a measurement element in a substantially loadless state along a frame groove formed in the inner circumferential surface of a rim of a spectacle frame. The measurement element holding mechanism includes a rod, balance spring, and evacuating mechanism. The rod is vertically movable and has an upper end portion on which the measurement element is mounted. The balance spring pushes the rod upward to hold the measurement element at a loading position during shape measurement. The evacuating mechanism regularly evacuates the measurement element to an evacuation position, thereby performing three-dimensional measurement of a rim shape. A spectacle frame shape measuring apparatus holder is also disclosed.