The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2005
Filed:
Mar. 17, 2003
Applicants:
Daniel Van Der Weide, Madison, WI (US);
Bjoern Rosner, Chicago, IL (US);
Inventors:
Daniel van der Weide, Madison, WI (US);
Bjoern Rosner, Chicago, IL (US);
Assignee:
Wisconsin Alumni Research Foundation, Madison, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 528 ; G01N 1316 ; G12B 2108 ; G12B 2120 ;
U.S. Cl.
CPC ...
Abstract
Frequency translation of microelectromechanical vibration signals such as a tip vibration signal in a scanning force microscopy system expands the versatility of existing control systems and enables new signal processing techniques. The vibration signal such as the cantilever probe tip vibration signal of a scanning force microscopy is frequency converted to a lower or higher frequency signal that is utilized to provide a control signal.