The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2005
Filed:
Jan. 25, 2001
William J. Walker, Houston, TX (US);
John M. Maclaren, Cypress, TX (US);
William J. Walker, Houston, TX (US);
John M. MacLaren, Cypress, TX (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A system and technique for detecting data errors in a memory device. More specifically, data errors in a memory device are detected by initiating an internal READ command or cleansing operation from a set of logic which is internal to the memory system in which the memory devices reside. Rather than relying on a READ command to be issued from an external device, via a host controller, the cleansing logic initiates a cleansing routine in response to an event such as an operator instruction or a periodic schedule. By implementing the cleansing operation, the system does not rely on external READ commands to verify data integrity. Further, a monitoring device is coupled between the cleansing logic and a memory scheduler. The monitoring device provides a feed back mechanism from which to vary the frequency of certain memory requests such as the cleansing and scrubbing operations. The cleansing routine may rely on typical ECC error logging mechanisms and may be used in a RAID memory architecture. Further, the cleansing routine may be used in conjunction with other error logging and correction logic, as well as scrubbing logic.