The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2005
Filed:
Feb. 01, 2001
Applicant:
Ming-yee Chiu, Princeton Junction, NJ (US);
Inventor:
Ming-Yee Chiu, Princeton Junction, NJ (US);
Assignee:
Setrix Aktiengesellschaft, Munich Bavaria, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 948 ;
U.S. Cl.
CPC ...
Abstract
A method and apparatus for remote monitoring of an analog meter is set out which employs a Hough Transform on the edge points of the meter scale to obtain the center of the scale. The graduation marks and the needle are detected from the intensity profile along various radii. Thereby, the meter reading can be flexibly adopted to different meter scales during an easy training process. The method can be modified for oblique reading of the scale.