The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2005

Filed:

Feb. 08, 2003
Applicants:

Akihiko Nishide, Tokyo, JP;

Sarah K. Patch, Milwaukee, WI (US);

Inventors:

Akihiko Nishide, Tokyo, JP;

Sarah K. Patch, Milwaukee, WI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 603 ;
U.S. Cl.
CPC ...
Abstract

To perform cone beam reconstruction by using projection data correctly corresponding to X-ray beam having passed through each pixel in the reconstruction area, data Dis obtained which is plane projected to a plane based on projection data D. Then, plane projection data Dto the projection plane pp is projected to the reconstruction area in the direction of X-ray transmission to obtain back projection pixel data D. Thereafter, back projection pixel data Dwill be added for each corresponding pixel for all views to obtain back projection data D. The present invention provides reconstruction by device of projection data correctly corresponding to the X-ray beam having passed through the reconstruction area. Through the plane projection to a plane the operation will become simplified and faster.


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