The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2005
Filed:
Jan. 28, 2002
Applicant:
Juerg Muentener, Balgach, CH;
Inventor:
Juerg Muentener, Balgach, CH;
Assignee:
Leica Microsystems (Switzerland) AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2106 ; G02B 2100 ;
U.S. Cl.
CPC ...
Abstract
The invention concerns a microscope having a basic body on or in which are arranged at least one microscope objective, at least one eyepiece, and at least one beam splitter that is provided in the beam path between the microscope objective and the eyepiece and that reflects a portion of the light out of the beam path to the eyepiece or reflects images into the beam path going to the eyepiece.