The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2005
Filed:
Jan. 20, 2004
Chih-kung Lee, Taipei, TW;
Shuen-chen Shiue, Keelung, TW;
Shu-sheng Lee, Taipei, TW;
Jiun-yan Wu, Taipei, TW;
Chii-wann Lin, Taipei, TW;
Shiming Lin, Taipei, TW;
Chih-Kung Lee, Taipei, TW;
Shuen-Chen Shiue, Keelung, TW;
Shu-Sheng Lee, Taipei, TW;
Jiun-Yan Wu, Taipei, TW;
Chii-Wann Lin, Taipei, TW;
Shiming Lin, Taipei, TW;
National Taiwan University, Taipei, TW;
Abstract
A multi-function opto-electronic detection apparatus for detecting molecular characteristics of a test sample. The appratuses comprises functional mode subsystems including a detecting light source subsystem for generating sampling beams for illuminating the test sample; a manipulation optics subsystem for aligning the sampling beam onto the test sample; a target signal processing subsystem for analyzing target beams emerging from the test sample resulting from the illuminating of the sampling beam; and a sample fixation subsystem for holding the test sample. The detecting light source subsystem, manipulation optics subsystem and target signal processing subsystem are assembled into one of several possible optical sampling setups for the detection characteristics of the test sample. The functional mode setups include at least ellispometer, confocal image scanner, photon tunneling scanning microscope and interferometer.