The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2005
Filed:
Jan. 15, 2003
Qingzhi Peng, San Jose, CA (US);
Hans Jürgen Richter, Palo Alto, CA (US);
Qingzhi Peng, San Jose, CA (US);
Hans Jürgen Richter, Palo Alto, CA (US);
Seagate Technology LLC, Scotts Valley, CA (US);
Abstract
A method of measuring the magnetic moment (Mt) and anisotropy field strength (H) of a perpendicular magnetic recording medium comprising a planar-surfaced perpendicular recording layer and a magnetically soft underlayer (SUL) is provided. A compensated magnetic moment (Mt)of the recording layer is determined for a given strength (H) of a generally in-plane magnetic field applied generally to the recording layer. The compensated magnetic moment (Mt)of the recording layer is determined for a plurality of different in-plane applied magnetic field (H) strengths to determine the variation of the compensated magnetic moment (Mt)of the recording layer as a function of the strength (H) of the generally in-plane applied magnetic fields. The remanent magnetic moment (Mt(0)) at zero (0) field strength (H) and the anisotropy field strength (H) is determined from the measured variation of the compensated magnetic moment (Mt)of the recording layer as a function of the strength (H) of the generally in-plane applied magnetic fields.