The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2005

Filed:

May. 09, 2003
Applicants:

Patrick G. Grant, Walnut Creek, CA (US);

Olgica Bakajin, San Leandro, CA (US);

John S. Vogel, San Jose, CA (US);

Graham Bench, Livermore, CA (US);

Inventors:

Patrick G. Grant, Walnut Creek, CA (US);

Olgica Bakajin, San Leandro, CA (US);

John S. Vogel, San Jose, CA (US);

Graham Bench, Livermore, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 4900 ;
U.S. Cl.
CPC ...
Abstract

This invention provides a system and method for measuring an energy differential that correlates to quantitative measurement of an amount mass of an applied localized material. Such a system and method remains compatible with other methods of analysis, such as, for example, quantitating the elemental or isotopic content, identifying the material, or using the material in biochemical analysis.


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