The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2005

Filed:

Jul. 21, 2003
Applicants:

Yasukazu Tokuhisa, Kuwana, JP;

Makoto Tanaka, Yokkaichi, JP;

Inventors:

Yasukazu Tokuhisa, Kuwana, JP;

Makoto Tanaka, Yokkaichi, JP;

Assignee:

Hitachi Metals Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 168 ;
U.S. Cl.
CPC ...
Abstract

A flow rate sensor capable of increasing a range where fluid flow rate can be detected with a high accuracy. The flow rate sensor includes: a sensor pipe; a resistor group; a reference resistor group; a constant current source; a first differential circuit; and a flow rate decision unit. The flow rate sensor further includes: a dummy sensor pipe where no fluid is flown; a dummy resistor group changing their resistance value according to the temperature and attached in the longitudinal direction, a dummy reference resistor group, a for-dummy constant current source, switch means for selectively connecting the resistor group with the dummy resistor group in series, a flow rate range increasing differential circuit for detecting a potential difference, and a third flow rate decision unit for obtaining the flow rate of the fluid flowing in the fluid passage according to the potential difference.


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Tokuhisa, Yasukazu. (2005). Flow rate sensor, flow rate measuring device, and flow rate control device (U.S. Patent No. 6843123). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6843123

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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