The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2005
Filed:
Sep. 10, 2001
Keiji Tsukada, Kashiwa, JP;
Akihiko Kandori, Hachioji, JP;
Tsuyoshi Miyashita, Kokubunji, JP;
Hiroyuki Suzuki, Hitachinaka, JP;
Hitoshi Sasabuchi, Mito, JP;
Keiji Tsukada, Kashiwa, JP;
Akihiko Kandori, Hachioji, JP;
Tsuyoshi Miyashita, Kokubunji, JP;
Hiroyuki Suzuki, Hitachinaka, JP;
Hitoshi Sasabuchi, Mito, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A magnetic field measurement apparatus includes a plurality of magnetometers each having SQUID's and three detection coils, one of which detects each of three orthogonal directional magnetic field components (B, B, B) of a magnetic field generated from a subject to be inspected, a display which displays time variation of waveforms of the magnitude (√(B+B+B)) of magnetic field synthesized by square sum of each of the three orthogonal directional magnetic field components of the magnetic field generated from the subject to be inspected, a holder for holding a Dewar's vessel for arranging magnetometers therein, and a controller for controlling a positional relationship between the subject to be inspected and the Dewar's vessel. Accurate time variation of the magnetic field generated from the subject to be inspected can be detected without influence of positional change of the subject to be inspected, by simultaneously measuring each of the three orthogonal directional magnetic field components (B, B, B) of the magnetic field generated from current sources in the subject to be inspected.