The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2005
Filed:
May. 29, 2002
Hans-peter Loock, Kingston, CA;
R. Stephen Brown, Kingston, CA;
Igor Kozin, Kingston, CA;
Zhaoguo Tong, Kingston, CA;
Richard D. Oleschuk, Kingston, CA;
Hans-Peter Loock, Kingston, CA;
R. Stephen Brown, Kingston, CA;
Igor Kozin, Kingston, CA;
Zhaoguo Tong, Kingston, CA;
Richard D. Oleschuk, Kingston, CA;
Queen's University at Kingston, Kingston, CA;
Abstract
The invention provides a method and apparatus for measuring one or more optical properties of a test medium, comprising providing an optical waveguide loop comprising a test medium, illuminating the optical waveguide loop with a plurality of light pulses, and detecting roundtrips of the light pulses at one or more locations along the loop, wherein the detected light pulses are indicative of one or more optical properties of the test medium. Preferably, ring-down time of said light pulses is determined. The invention provides measures of optical properties such as absorbance and refractive index of a test medium such as a gas, a liquid, and a solid material.