The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2005
Filed:
Dec. 17, 2002
Applicants:
Timothy C. Munks, North Granby, CT (US);
Andrew Finch, Avon, CT (US);
Scott Merritt, McLean, VA (US);
Inventors:
Timothy C. Munks, North Granby, CT (US);
Andrew Finch, Avon, CT (US);
Scott Merritt, McLean, VA (US);
Assignee:
JDS Uniphase Corporation, San Jose, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2700 ;
U.S. Cl.
CPC ...
Abstract
A micro-optic Mach-Zehnder interferometer with a differential delay of n bit periods, where n is an integer number, and thermal bias control is useful as a spectral filter in front of a differential detection system to accomplish a balanced receiver. The interferometer may also be arranged as a Michelson interferometer or a dual-plate interferometer.