The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2005
Filed:
Jan. 26, 2004
Keisuke Araki, Yokohama, JP;
Tsunefumi Tanaka, Yokohama, JP;
Makoto Sekita, Yokohama, JP;
Kenichi Kimura, Kawasaki, JP;
Takeshi Akiyama, Yokohama, JP;
Toshihiro Sunaga, Kawasaki, JP;
Keisuke Araki, Yokohama, JP;
Tsunefumi Tanaka, Yokohama, JP;
Makoto Sekita, Yokohama, JP;
Kenichi Kimura, Kawasaki, JP;
Takeshi Akiyama, Yokohama, JP;
Toshihiro Sunaga, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An optical element comprising an object-side imaging element for imaging an object on an intermediate image plane in an optical path before a final image plane and an image-side imaging element for reimaging an object image formed on the intermediate image plane, on the final image plane, wherein at least one of the object-side imaging element and the image-side imaging element comprises an off-axial curved surface, and wherein aberration is generated by both of the object-side imaging element and the image-side imaging element, thereby flattening (disturbance of) a light intensity distribution caused on the final image plane by a noise source at or near the intermediate image plane.