The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2005
Filed:
May. 28, 2002
Applicants:
Stefan Dietrich, Türkenfeld, DE;
Manfred Dobler, München, DE;
Thilo Marx, Villingen-Schwenningen, DE;
Peter Mayer, München, DE;
Inventors:
Stefan Dietrich, Türkenfeld, DE;
Manfred Dobler, München, DE;
Thilo Marx, Villingen-Schwenningen, DE;
Peter Mayer, München, DE;
Assignee:
Infineon Technologies AG, Munich, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1114 ;
U.S. Cl.
CPC ...
Abstract
The imaging system provides assistance during the positioning of a measuring tip as it is placed onto a contact region of a microchip, in order to measure an on-chip signal. The contact region is imaged in a magnified fashion. An insertion device is provided that is suitable for providing a display of the on-chip signal in the imaging plane.