The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2005
Filed:
Oct. 16, 2002
Richard Van Neste, Outremont, CA;
Claude Belleville, L'Ancienne-Lorette, CA;
Daniel Pronovost, Québec, CA;
Alain Proulx, St-Étienne de Lauzon, CA;
Richard Van Neste, Outremont, CA;
Claude Belleville, L'Ancienne-Lorette, CA;
Daniel Pronovost, Québec, CA;
Alain Proulx, St-Étienne de Lauzon, CA;
Fiso Technologies Inc., Sainte-Foy, CA;
Abstract
An apparatus and a method of measuring an optical path difference in a sensing interferometer. Light from a source is directed in the sensing interferometer. The light reflected from the sensing interferometer is splitted into first and second beams respectively directed into two reference interferometers having optical path differences greater than the coherence length of the source and such that the optical signals are in quadrature. The intensities of the light transmitted by the reference interferometers and recombined light reflected from the reference interferometers are detected for measuring the optical path difference in the sensing interferometer. Additional light sources allow for correction of internal perturbations and absolute measurement of the optical path difference in the sensing interferometer.