The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2005

Filed:

Jul. 25, 2002
Applicants:

Noriyuki Narisada, Akashi, JP;

Hiroyuki Fujimoto, Kobe, JP;

Yusuke Mori, Kobe, JP;

Inventors:

Noriyuki Narisada, Akashi, JP;

Hiroyuki Fujimoto, Kobe, JP;

Yusuke Mori, Kobe, JP;

Assignee:

Sysmex Corporation, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3348 ; G01N 2100 ; G06F 1900 ;
U.S. Cl.
CPC ...
Abstract

A method of classifying particles indicated on a two-dimensional frequency distribution map into particle clusters, includes the steps of: dividing the particles into a first cluster and a second cluster by a line containing a mode coordinate of the particles, presuming a third cluster so that the first and third clusters are symmetrical with respect to the mode coordinate, calculating variance and covariance of a cluster including the first and third clusters to obtain an ellipse region surrounding the first and third clusters based on the calculated variance and covariance, and determining the particles in the obtained ellipse region as a particle cluster.


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