The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2005

Filed:

Feb. 28, 2003
Applicant:

David S. Yip, La Mirada, CA (US);

Inventor:

David S. Yip, La Mirada, CA (US);

Assignee:

Northrop Grumman Corporation, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03H 964 ; H03H 925 ;
U.S. Cl.
CPC ...
Abstract

A reflective grating () for a SAW filter () or resonator. The reflective grating () is formed by selectively dithering grating grid lines () with respect to a uniform spaced grid of M number of grid lines () per each N wavelength (λ) of the grating () (Nλ/M), where λ is the wavelength of the center of the frequency band of interest, M and N are integers and M>N. M and N are selected so that the grating () does not have a net reflection when all of the grid lines () are uniformly spaced. By controlling the dithering pattern of the grid line in each sampling period of Nλ, any desired net distributed reflectivity from the grating can be implemented in both magnitude and phase.


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