The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2005

Filed:

Jan. 15, 2001
Applicants:

Minoru Yoshida, Yokohama, JP;

Seiichi Ohashi, Yokohama, JP;

Inventors:

Minoru Yoshida, Yokohama, JP;

Seiichi Ohashi, Yokohama, JP;

Assignee:

Innotech Corporation, Yokohama, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3102 ;
U.S. Cl.
CPC ...
Abstract

A probe (A) has a cutting blade portion () at a tip end that is brought into contact with a pad electrode (). The cutting blade has a cutting edge that is in a plane parallel to the direction of sliding of the blade over a pad electrode, when the edge is brought into contact with the electrode. The cutting edge () has a sloping or curved shape that comes closer to the electrode from the front side to the rear side of the blade along the direction of sliding. Thus, as the cutting edge () cuts into an insulating coating () formed on the surface of the electrode, the probe ensures satisfactory electrical conduction between the probe (A) and the electrode because it cuts through the coating without causing swarfs.


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