The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2005

Filed:

Aug. 03, 2001
Applicants:

Joseph Robinson, Portland, OR (US);

Kenneth H. Church, Stillwater, OK (US);

Inventors:

Joseph Robinson, Portland, OR (US);

Kenneth H. Church, Stillwater, OK (US);

Assignees:

Ascend Instruments, Inc., Hillsboro, OR (US);

Sciperio, Inc., Stillwater, OK (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3731 ; B23K 2638 ;
U.S. Cl.
CPC ...
Abstract

Sample preparation apparatus and method includes a wafer stage platform with an optical microscope and integrated pattern recognition to automatically address specific locations on the wafer sample of interest. A laser attaches to the optical microscope to mill a set pattern around the area of interest. A precision micro-manipulator engages the sample support structure, extracts the structure, and places the structure in a TEM holder or holder tip. The holder or holder tip can then be placed inside a FIB for final thinning, followed by direct transfer into the TEM.


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