The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2005
Filed:
Feb. 21, 2003
Steven E. Dykes, Powell, OH (US);
Allan H. Clauer, Worthington, OH (US);
Jeff L. Dulaney, Dublin, OH (US);
David F. Lahrman, Powell, OH (US);
Mark O'loughlin, Galloway, OH (US);
Steven E. Dykes, Powell, OH (US);
Allan H. Clauer, Worthington, OH (US);
Jeff L. Dulaney, Dublin, OH (US);
David F. Lahrman, Powell, OH (US);
Mark O'Loughlin, Galloway, OH (US);
LSP Technologies Inc., Dublin, OH (US);
Abstract
A method of controlling the application of laser peening overlays on the surface of a workpiece to reduce the variability of shock waves generated therein, comprises applying an energy-absorbing overlay to a portion of the surface of a workpiece, measuring the thickness of the energy-absorbing overlay in at least one location on the energy-absorbing overlay, applying a transparent overlay material over the energy-absorbing overlay, measuring the thickness of the transparent overlay in at least one location on the transparent overlay, determining if the measured values for each overlay is within a specified range, and directing a pulse of coherent energy to the workpiece to create a shock wave therein when the measured values are within the specified range.