The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2005

Filed:

Jul. 11, 2001
Applicants:

Mitsuru Oonuma, Tokyo, JP;

Atsushi Ninomiya, Ome, JP;

Tadashi Ohishi, Ibaraki, JP;

Inventors:

Mitsuru Oonuma, Tokyo, JP;

Atsushi Ninomiya, Ome, JP;

Tadashi Ohishi, Ibaraki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2101 ;
U.S. Cl.
CPC ...
Abstract

It is an object of the present invention to provide a small-sized automatic analyzer that is convenient in use, wherein an insertion of an urgent sample can be easily carried out, its safety in operation and operability can be improved and its erroneous operation can be prevented. In order to accomplish the object of the present invention, a top panel of a body is provided with a sample disk storing a plurality of sample cups, a reagent disk storing a plurality of reagent bottles, and a reaction disk storing a plurality of reaction cuvettes for reacting sample liquid in sample cups with the reagent in reagent bottles and there is arranged an indicator illuminated when the sample disk is stopped, and there is provided a cover for covering a part of the top panel of the body, and when the cover is closed, a part of the sample disk is exposed out of the cover. The sample disk is provided with sample disk covers constituted in two-divided segments, and one of the covers is arranged at a position where it is removably exposed outside the cover when the cover is closed.


Find Patent Forward Citations

Oonuma, Mitsuru. (2005). Automatic analyzer (U.S. Patent No. 6841126). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6841126

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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