The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6840763 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 11, 2005

Filed:

Feb. 14, 2002
Applicant:

Yoo Woo Sik, Palo Alto, CA (US);

Inventor:

Yoo Woo Sik, Palo Alto, CA (US);

Assignee:

WaferMasters, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F27D 1502 ;
U.S. Cl.
CPC ...
Abstract

A wafer processing system which requires no isolation between the operational areas within the processing system. The system of the present invention includes operational areas, such as a loading area, a transport area, and a reactor or thermal processing area. Advantageously, since there are no isolation devices or gate valves separating the areas, the processing system effectively has each operational area combined into a 'single' chamber. Preferably, the single chamber has a single slit valve, hinge door, or other vacuum sealable door disposed proximate to the loading area to allow for the removal/insertion of the wafers into the loading area. Once the door to the loading area has been closed the internal pressure within the chamber can be kept uniform throughout each operational area.


Find Patent Forward Citations

Sik, Yoo. (2005). Wafer processing apparatus (U.S. Patent No. 6840763). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6840763

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