The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2005
Filed:
Jul. 25, 2003
John R. Reader, Jr., Newark, DE (US);
Amichai Shdaimah, Ardmore, PA (US);
Fred L. Ferguson, Wilmington, DE (US);
John R. Reader, Jr., Newark, DE (US);
Amichai Shdaimah, Ardmore, PA (US);
Fred L. Ferguson, Wilmington, DE (US);
Waters Investment Limited, New Castle, DE (US);
Abstract
The present invention relates to apparatus, systems, and methods for opening an autosampler sealed sample pan prior to TGA testing. The sealed sample pan comprises a pan, cover, and bail. A notch is formed in the seal sample pan cover. The cover can be opened by applying a concentrated force to the inside of the notch with a punch element integrated into the autosampler. This causes the center disk portion of the cover to be partially sheared and the sealed sample pan to be opened. It also prevents the punch element from touching the sample. A force sensor is used to determine if the cover has been opened. If the cover has been opened, then the sample pan is loaded to the TGA balance. If the cover has not been opened, the autosampler will not load the pan and will automatically move to the next sealed sample pan.