The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2005

Filed:

Feb. 19, 2003
Applicant:

Yasushi Kouno, Nagoya, JP;

Inventor:

Yasushi Kouno, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 168 ;
U.S. Cl.
CPC ...
Abstract

The flow amount measuring apparatus has two detecting portions for generating signal indicative of flow amount respectively. The outputs of two detecting portions are subject to a differential amplification to obtain large output signal and low amplitude ratio. A plurality of resistors providing the detecting portion may be formed on a single substrate. The output characteristic of the flow amount measuring apparatus can be adjusted by adjusting the gain and the offset. The offset includes a temperature dependent first offset component and a constant second offset component. The first offset component varies in accordance with temperature of fluid so as to reduce temperature dependency of the output characteristic. As a result, it is possible to measure flow amount accurately.


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