The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2005
Filed:
Jun. 14, 2002
David A. Jackson, Point Roberts, WA (US);
Brian M. Bliven, San Jose, CA (US);
Patrick B. O'mahony, San Jose, CA (US);
David A. Jackson, Point Roberts, WA (US);
Brian M. Bliven, San Jose, CA (US);
Patrick B. O'Mahony, San Jose, CA (US);
Snap-On Incorporated, Pleasant Prairie, WI (US);
Abstract
A position determination system comprises a first measuring apparatus and a second measuring apparatus. The first measuring apparatus includes a first sensing device having a sensing field for obtaining positional data of a first testing target, a calibration target rigidly linked to the first sensing device, wherein the positional relationship between the first sensing device and the calibration target is known. The system has a repositioning mechanism for repositioning the sensing field of the first sensing device. The second measuring apparatus includes a second sensing device having a sensing field for obtaining positional data of a second testing target, a calibration sensing device rigidly linked to the second sensing device for obtaining positional data of the calibration target, wherein the positional relationship between the second sensing device and the calibration sensing device is known, and a repositioning mechanism for repositioning the sensing field of the second sensing device. Depending on different needs, the repositioning mechanism readjust the viewing fields of the sensing devices such that the testing targets are properly within the sensing fields of the sensing devices.