The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2005
Filed:
Nov. 19, 2001
Christopher K Sutton, Everett, WA (US);
William R Pritchard, Marysville, WA (US);
Kirsten C Carlson, Snohomish, WA (US);
James Martin, Marysville, WA (US);
Christopher K Sutton, Everett, WA (US);
William R Pritchard, Marysville, WA (US);
Kirsten C Carlson, Snohomish, WA (US);
James Martin, Marysville, WA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
An electronic test system having an object oriented hierarchical infrastructure including classes that allow a test developer or a test user to design a desired electronic test system. The class relationships define the function of the electronic test system. Classes include a procedure class, a test class, a measurement class, a datapoint class, a parameter class, a DUT class, a test system class, a specification class, a run procedure class, a result class, a plug-in class, an exec class, a model class, a device class, a test system device class, a user menu item class, an application class, and a state class. These classes are implemented in a hierarchical structure in which a datapoint is a subset of a measurement, a measurement is a configuration for a test, a test is a group of measurements that share the same test algorithm, and a procedure is an ordered list of tests to be run, and includes a list of measurements and datapoints.