The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2005

Filed:

Sep. 10, 2002
Applicants:

Alexei Volkov, Mountain View, CA (US);

Allan S. Jacobs, Palo Alto, CA (US);

Inventors:

Alexei Volkov, Mountain View, CA (US);

Allan S. Jacobs, Palo Alto, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1500 ;
U.S. Cl.
CPC ...
Abstract

An invention is provided for testing in a Java based environment. The method includes launching a test harness in a first JVM, and starting a virtual machine (VM) agent in a second JVM. The VM agent is placed in communication with the test harness. The VM agent then executes a test application such that both the test application and the VM agent execute in the second JVM. In this manner, the VM agent is restarted using the test harness if the second JVM fails.


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