The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2005
Filed:
Nov. 20, 2003
Cheol-jae Park, Gyeongbuk, KR;
Seong-cheol Hong, Gyeongbuk, KR;
Kwan-soo Kim, Gyeongbuk, KR;
Kyu-bum Han, Gyeongbuk, KR;
Young-jun JO, Gyeongbuk, KR;
Seong-gap Choi, Gyeongbuk, KR;
Wakamiya Yoshinori, Tokyo, JP;
Nitta Isoko, Tokyo, JP;
Inami Haruki, Tokyo, JP;
Cheol-Jae Park, Gyeongbuk, KR;
Seong-Cheol Hong, Gyeongbuk, KR;
Kwan-Soo Kim, Gyeongbuk, KR;
Kyu-Bum Han, Gyeongbuk, KR;
Young-Jun Jo, Gyeongbuk, KR;
Seong-Gap Choi, Gyeongbuk, KR;
Wakamiya Yoshinori, Tokyo, JP;
Nitta Isoko, Tokyo, JP;
Inami Haruki, Tokyo, JP;
Abstract
The present invention relates to an apparatus and method for diagnosing faults in hot strip finishing rolling, which diagnoses thickness faults in hot strip finishing rolling, using preset data and real-time data on rolling and control conditions, equation models representing control and physical phenomena and a database constructed based on operation experiences. The present invention comprises: a Supervisory Control Computer (SCC); an actually measured data collection unit; an exit side thickness gauge loaded-on determination unit; a part identification unit; an on-gauge ratio calculation unit; a primary fault determination unit; a secondary fault determination unit; and a confidence rate evaluation unit.