The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2005
Filed:
Sep. 17, 2001
Katsuhide Shimmo, Osaka, JP;
Shinji Kawamoto, Osaka, JP;
Terufusa Kunisada, Osaka, JP;
Kenichi Nakama, Osaka, JP;
Katsuhide Shimmo, Osaka, JP;
Shinji Kawamoto, Osaka, JP;
Terufusa Kunisada, Osaka, JP;
Kenichi Nakama, Osaka, JP;
Nippon Sheet Glass, Co., Ltd., Osaka, JP;
Abstract
A reflection type diffraction grating according to the present invention has a structure in which a metal film as a first layer with reflectance not lower than 30% with respect to the wavelength of incident light and a transparent dielectric film as a second layer are laminated successively on the surface of the reflection type diffraction grating. With respect to the wavelength of incident light, the metal film has a refractive index selected to be not higher than 1.5 and an extinction coefficient selected to be not smaller than 6.0. The transparent dielectric film has a refractive index selected to be in a range of from 1.30 to 1.46, both inclusively, with respect to the wavelength of incident light and has an optical film thickness selected to be in a range of from 0.20λ to 0.38λ, both inclusively, when λ is the wavelength of incident light.