The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2005
Filed:
Nov. 15, 2003
Manouchehr E. Motamedi, Newbury Park, CA (US);
Ali E. Dabiri, San Diego, CA (US);
Manouchehr E. Motamedi, Newbury Park, CA (US);
Ali E. Dabiri, San Diego, CA (US);
Other;
Abstract
Electromagnetic waves in wide frequency ranges up to photonics have been used for applications to time-domain imaging (TDI). Realistic time domain imaging requires a rapid optical delay line on the order of 100 ps with sampling rate at least 100 Hz. Present available optical time delay systems suffer either from low sampling rate or low time delay length, deviating from ideal requirements. The purpose of this invention is to introduce a miniature and rapid scanning optical delay line based on micro-opto-electro-mechanical system (MOEMS) technology to improve the data acquisition in time domain imaging, capable of sampling rate beyond 100 Hz and time delays beyond the 100 ps.