The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2005
Filed:
Feb. 02, 2000
Fred Andree, Brookline, MA (US);
Steve Pratt, Acton, MA (US);
Shenbo Yu, Nashua, NH (US);
Craig Cook, Wayland, MA (US);
Fred Andree, Brookline, MA (US);
Steve Pratt, Acton, MA (US);
Shenbo Yu, Nashua, NH (US);
Craig Cook, Wayland, MA (US);
Zoran Corporation, Sunnyvale, CA (US);
Abstract
A system and method of processing an image including black text data and non-black text data are described. The system and method use a parametric analysis for discrimination of halftones, texts, and photographs. The parametric analysis provides results that track measurable image metrics without the inherent risk of errant decision making during classification. The creation of symbolic representations is intrinsically a classification process that is subject to error. It represents a fundamental departure from fuzzy logic image segmentation. In the parametric analysis, no pattern matching, no auto-correlation, no screening parameter calculation, and no conventional edge detector (such as a high pass filter) are used.